Automatic Orientation Mapping in the Transmission Electron Microscope

Three-dimensional orientation mapping in the transmission electron microscope.

Over the past decade, efforts have been made to develop nondestructive techniques for three-dimensional (3D) grain-orientation mapping in crystalline materials. 3D x-ray diffraction microscopy and differential-aperture x-ray microscopy can now be used to generate 3D orientation maps with a spatial resolution of 200 nanometers (nm). We describe here a nondestructive technique that enables 3D ori...

Orientation Microscopy in the Transmission Electron Microscope - Investigations of Small Orientations Changes by Means of Orientation Mapping in TEM

Precession Electron Diffraction in the Transmission Electron Microscope: electron crystallography and orientational mapping

Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEM instruments of voltages 100 to 300 kV to turn them into true electron diffractom...

Isotope analysis in the transmission electron microscope

The Ångström-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition. Here we differentiate between two isotopes of the same element by quantifying how likely the energetic imaging electrons are to eject atoms. First, we measure the dis...

Electron microscopy’s multi-tool: the Scanning Transmission Electron Microscope

A dedicated Scanning Transmission Electron Microscope is ideally coupled with the energy dispersive x-ray and electron energy loss spectroscopies to obtain information about the chemical composition, morphology and electronic structure on the nanoscale. With several signals being available simultaneously with the pass of a subnanometre-sized beam, this instrument can answer questions from a bro...